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Justification for the Advanced Research Workshop print
 
 
The advanced research workshop will provide a forum for discussion on recently developed experimental methods for noise research in nanoscale electronic devices. It will bring together specialists in the area of transport and stochastic phenomena in nanoscale Physics, dealing with systems for future nano-scale electronics. The approach is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage - current and thermal dependence. The present knowledge of measurement methods for mesoscopic devices will be summarized, to identify directions for future research, related to downscaling effects.
The directions for future research of fluctuation phenomena in quantum dot and quantum wire devices will be specified. Another approach is to emphasize the fact, that nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.
This ARW will promote and improve links between scientist from NATO and Partner countries and will also help to strengthen the scientific communities in the new NATO and Partner countries. The workshop will link the theoretical assessment of the phenomenon of noise with a discussion of the advanced experimental methods. It also deals with problems, discussed this year at NATO ARW "Quantum noise in mesoscopic Physics", held in Delft and "Theory of quantum transport in nanoscale devices", held in St Petersburg, Russia.

Main topics:
The Advanced Research Workshop will consist of invited and contributed papers in the following areas:

Noise in Mesoscopic and Quantum Scale Devices
Noise in Optical Devices
High Frequency Noise
RTS noise in Nano-scale Devices
Noise Measurement Techniques
Low Frequency Probe Measurements on a Wafer Level
Noise Measurements in Single-charge Devices
Measurement Techniques of Bulk and Contact Noise and Non-Gaussianity

The ARW is planned to be a part of the working programme on the experimental studies focused on nanoscale devices and their application. The main idea of the ARW is to bring together researchers having experience in collaborative research to discuss new results and initiate new joint research programmes.

 
     
   
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